How surface roughness and work-function patchiness raise intrinsic emittance · revision history
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- Title
- How surface roughness and work-function patchiness raise intrinsic emittance
- Plain
- Real cathode surfaces are bumpy and patchy at the nanometer scale, which deflects electrons as they leave. The size of this effect for real materials is not well quantified.
- Precise
- For a photocathode with measured topography (rms height, correlation length) and work-function variation in an extraction field $E \sim 0.1 \text{ to } 1\,\mathrm{MV}/\mathrm{cm}$, compute the contribution of slope and local transverse fields to MTE, and determine the surface quality needed for MTE below $5\,\mathrm{meV}$.
- Settled by
- Calculated MTE from measured surface maps compared with MTE measured on the same cathodes at several extraction fields.
- Kind
- well-posed
- Answer type
- value
- References
- (empty)
- Literature status
- open
- Status note
- (empty)
- Posed since
- (empty)